• 原子显微镜扫描对醛基化玻片表面形貌进行分析

    Scanning aldehyde group glass slide by atomic force microscopy study the surface shape.

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  • 并且分别利用原子显微镜傅立叶变换红外光谱薄膜进行界面形态和微观结构分析

    The surface morphology and chemical structure of the film are characterized by Atomic Force Microscope (AFM) and Fourier Transform Infrared Spectroscope (FTIR).

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  • 用俄歇电子能谱(AES)、扫描电镜(sem)原子显微镜(afm)对薄膜组成成分表面形貌进行了分析

    Auger electron spectroscopy (AES), scanning electron microscopy (SEM) and atomic force microscopy (AFM) are used to analyze component and surface morphology of the films.

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  • 文中原子显微镜(afm)电场诱导氧化结构部分形状特征进行了分析讨论

    This paper analyzes and discusses some structure's features on the surface of silicon by atomic force microscope (AFM) electrical field induced oxidation.

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  • 使用X射线光电子能谱仪(XPS)、X射线衍射仪(XRD)、原子显微镜(afm)对薄膜结构进行分析

    The structural properties of the films were analyzed by X ray photo electron spectroscopy (XPS), X ray diffractometer (XRD) and atomic force microscope (AFM).

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  • 利用原子显微镜二次离子分析探针多晶硅薄膜高温退火特性进行实验研究

    An experiment was conducted to study the high-temperature annealing characteristics of polysilicon films using atomic force microscope, secondary ion mass spectroscopy and probe.

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  • 用于生物体系成象原子显微镜等新的分析技术以及其它表面材料分析技术已经即将推出商品化仪器

    Atomic force microscopy for the imaging of biological systems, and other techniques for surface and materials analysis are already, or may soon be, appearing as commercialized instruments.

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  • 用激光拉曼原子显微镜等现代分析手段研究了磁控溅射石墨制备薄膜结构和特性。

    Raman spectrometer and atom force microscope were employed to study and determine the structure and characteristics of the films prepared by the method of magnetron sputtering with graphite target.

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  • 原子显微镜AFM),扫描电子显微镜SEM),X 射线粉末衍射仪XRD),BET 比表面积分析仪对结构进行表征

    The structures of RDX/RF aerogel were characterized by atomic force microscopy(AFM), scanning electron microscopy(SEM), X-ray powder diffraction(XRD), and BET method.

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  • 利用原子力显微镜(afm)、扫描电镜(sem)光学显微镜观察分析硫化亚铁喷涂层表面截面面形貌

    AFM, SEM equipped with EDX and optical microscope were employed to observe and analyze the morphologies of the surface, cross-section and wear scar of the coatings.

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  • 采用原子显微镜低温吸附法研究木浆纤维孔隙结构,并运用分形理论对孔隙结构进行了分析

    The pore structure of eucalyptus pulp fibers was investigated by means of atomic force microscopy (AFM) and low-temperature nitrogen adsorption.

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  • 所得结果原子显微镜纳米尺寸上的结构信息分析结果作了对比

    The obtained results were compared with the surface morphology information at nanometer size from atomic force microscopy (AFM).

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  • 经过处理薄膜机械强度比未采用氨处理薄膜大大增强,利用红外光谱原子力显微镜(afm)等分析手段分析了薄膜强度增强的机理

    After ammonia process treatment, the mechanical property of film was improved obviously and the mechanism was discussed by IR spectrum, AFM analysis methods.

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  • 采用调制原子显微镜扫描电镜线扫描功能对复合材料界面相精细结构进行分析

    Force modulation atomic force microscope and linear scanning system of scanning electron microscope were carried out to analyze the microstructure of composite interface.

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  • 运用差扫描量热分析动态分析、交流阻抗谱、扫描电镜原子力显微镜体系性能和形态进行研究

    DSC, DMA, complex impedance analysis, SEM, and AFM were used to investigate the properties and morphology of the system.

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  • 通过沉降时间观察分散性,采用激光粒度扫描电镜原子力显微镜对分散效果进行进一步分析

    Then the dispersity was evaluated with settlement time. And laser particle size analyzer, SEM and AFM were employed to confirm the results.

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  • 通过沉降时间观察分散性,采用激光粒度扫描电镜原子力显微镜对分散效果进行进一步分析

    Then the dispersity was evaluated with settlement time. And laser particle size analyzer, SEM and AFM were employed to confirm the results.

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