研究了大气状态下应用扫描隧道显微镜（STM）对金薄膜和单晶硅材料进行了纳米级电场加工实验。
The nano dots fabrication tests of Au film and single-crystal silicon were performed in air using scanning tunneling microscope(STM).
扫描隧道显微镜(STM)在电化学领域有广泛应用。
Scanning tunnel microscope (STM) is widely used in fields of electrochemical research.
综述了近二十年来以扫描隧道显微镜为代表的、基于探针的成像显微装置基本原理及应用领域。
Reviewed are the basic principles and application fields of probe-based imaging microscope, represented by scanning tunneling microscopes for the recent 20 years.
利用该方法研制的成品弯曲光纤探针应用于光子扫描隧道显微镜系统，得到了比较理想的样品图像。
The bend optical fiber probe is used in developed NSOM system and the perfect images are obtained.
原子力显微镜(afm)是在扫描隧道显微镜(STM)基础上发明的又一种纳米级高分辨率显微技术，目前已在高分子领域获得了广泛的应用。
Atomic force microscope (AFM) was invented as another nanoscale microscopy with high resolution based on scanning tunneling microscope (STM) and has extensive application in polymer field.
原子力显微镜(afm)是在扫描隧道显微镜(STM)基础上发明的又一种纳米级高分辨率显微技术，目前已在高分子领域获得了广泛的应用。
Atomic force microscope (AFM) was invented as another nanoscale microscopy with high resolution based on scanning tunneling microscope (STM) and has extensive application in polymer field.
应用推荐