扫描探针显微镜- d21提供自动频率，相位和电压匹配使用模拟或离散输出信号。
The SPM-D21 provides automatic frequency, phase and voltage matching using either analog or discrete output signals.
一个快速的水管解耦许可证扫描探针显微镜- d21运作，在水管平行没有额外的外部保护继电器。
A quick mains decoupling permits the SPM-D21 to operate in mains parallel without additional external protection relays.
提高作为纳米科技的“眼”和“手”的扫描探针显微镜(SPM)的测量和定位精度，是纳米仪器界始终追求的目标。
It is an objective for nanometer instrument researcher to improve the measurement precision of scanning probe microscope (SPM), the eye and hand of nanometer science and technology.
测量中，把扫描隧道显微镜的探针扫描线作为参考栅，把物质原子晶格栅结构作为试件栅，对这两组栅线干涉形成的云纹进行了纳米级变形测量。
In the measurement, the moire pattern is generated by the scanning line of scanning tunneling microscope and the atomic lattice of substance as a specimen grating.
选用典型的二氧化钛纳米超亲水薄膜，用扫描探针显微镜(SPM)和电化学测试系统进行一般性的表征。
A typical nanostructured titania super hydrophilic film was chosen for general characterization employing a Scanning Probe Microscope (SPM) and an electrochemical measurement system.
扫描探针显微镜(SPM)当前的发展趋势是功能复合化和数字化。
A general trend of Scanning Probe Microscope (SPM) is to multiple functionality and digitalization.
针对法兰盘加工面上出现的黑纹缺陷，采用光学显微镜、扫描电镜和电子探针等测试方法对其进行了分析。
Analysis is made on the dark lines defects occurring over the working surface of flange by measurement with the optical microscope, Scanning electro microscope (SEM) and electronic probe.
近场光显微镜(NFOM)是一种高分辩率的扫描探针显微镜。
Near Field Optical Microscope (NFOM) is a kind of scanning probe microscopy with high resolution.
探讨了外界激振对扫描探针显微镜(SPM)扫描图像的影响。
The influence of external vibration on scanned images of scanning probe microscope (SPM) is discussed.
利用扫描探针显微镜(SPM)能够实现纳米级电子器件和机械器件的加工。
Nanofabrication in electrical field by Scanning Probe Microscope (SPM) can fabricate electrical devices and mechanical structures in nanometer scale.
扩散偶和合金样品采用光学显微镜、扫描电镜和电子探针显微分析技术进行分析。
Both the diffusion couple specimens and the alloys were examined by means of optical microscopy, scanning electron microscopy, and electron probe microanalysis.
扫描探针显微镜是近十几年来在表面特征、表面形貌观测方面最重大的进展之一，是纳米测量学的基本工具。
The scanning probe microscope is one of the most important developments on observing and determining surface topography and surface properties in near ten years and is basic tool of nano-measurement.
目前，我国引进的一般商业性的SPM(扫描探针显微镜)中缺少误差的自动修正和改进系统。
Up to now the imported commercial scanning probe microscope (SPM) has not an automatic error correcting and reducing system.
通过使用原子吸收光谱仪，扫描显微镜和能量色散X射线谱仪对覆膜光纤探针进行表征。
Atomic absorption spectrometry (AAS), scanning electron microscopy (SEM), and energy dispersive X-ray spectrometry (EDXS) are carried out to characterize the deposition on fiber probe.
对扫描探针显微镜(SPM)仪器漂移的定量测量的几种方法进行探讨，提出应用二维零位标记进行漂移测量。
Several quantitative drift measurement techniques for scanning probe microscopy (SPM) were introduced. A new method using two-dimensional zero-reference masks was proposed to measure the SPM drift.
钨探针是扫描隧道显微镜（STM）常用探针之一。
Tungsten probe is one of the common probes used in scanning tunnel microscopy (STM).
电化学扫描探针显微镜(ECSPM)已成为研究固-液界面结构的有力的工具。
Electrochemical scanning probe microscopes (ECSPM) have become one of the most powerful techniques for studies of solid liquid interfaces.
碳纳米管由于特殊的空间结构和突出的物理性能而广泛用于各类扫描探针显微镜。
Carbon nanotube has been expected to be a suitable material to the apex of scanning probe microscopy (SPM) tips because of its unique physical properties and special structures.
近场光学显微镜是利用探针的扫描来获得样品表面信息的。
Near-field optical microscopy, based on scanning sample surfaces by the tip of optical probe, obtained the imagined information about the object surface.
压电工作台属典型的压电元件驱动的微定位器，在扫描探针显微镜等仪器设备中应用较广。
Piezoelectrically driven micropositioning stage (piezo-stage) is one of the typical piezoelectrically driven actuator which is widely used in scanning probe microscopy.
三维压电陶瓷扫描器是扫描探针显微镜的关键部件。
The piezoelectric scanner is one of the key components of scanning probe microscope.
利用光学显微镜、扫描电子显微镜和电子探针研究了不同保温时间对钢液中非金属夹杂物的形状、成分和尺寸的影响。
The effects of different holding times on the shapes, compositions and sizes of the inclusions were investigated by using optical and scanning electron microscopes and by the electron microprobe.
扫描探针显微镜(SPM)现在不仅用于表面微观形貌的检测，同时也用于纳米超精密加工和原子操纵。
Scanning probe microscope (SPM) is used not only for measuring the micro profiles of surfaces, but also for nano ultraprecise machining and atom manipulation now.
探针是所有扫描探针显微镜的关键部件。
Probe is a crucial part of all the scanning probe microscopes.
综述了近二十年来以扫描隧道显微镜为代表的、基于探针的成像显微装置基本原理及应用领域。
Reviewed are the basic principles and application fields of probe-based imaging microscope, represented by scanning tunneling microscopes for the recent 20 years.
单管式扫描器的结构误差是影响扫描探针显微镜测量精度的主要误差因素之一。
Tube scanner′s structure errors have great effect on the measurement accuracy of Scanning Probe Microscope(SPM).
这为实验上制备出性能优良的探针，为拓宽扫描近场光学显微镜的应用范围奠定基础。
The work establish the foundation for fabricating good probe experimentally and extending the application of scanning near field optical microscope (SNOM).
原子力显微镜（AFM）的微探针系统是典型的微机械构件，它在接触扫描过程处于耦合变形状态。
Micro cantilever probe of atomic force microscope (AFM) is a typical micro mechanical component, which is under a coupling deformation during the contact scanning process.
原子力显微镜（AFM）的微探针系统是典型的微机械构件，它在接触扫描过程处于耦合变形状态。
Micro cantilever probe of atomic force microscope (AFM) is a typical micro mechanical component, which is under a coupling deformation during the contact scanning process.
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