本发明涉及具有可标引的探针针尖的测试探针。
The present invention is directed to a test probe having an indexable probe tip.
把测试探针连接到插头1和2，并记下欧姆表读数。
Attach test leads to pins 1 and 2 and note ohmmeter reading.
把测试探针连接到插头5和6，并记下欧姆表读数。
Attach test leads to pins 5 and 6 and note ohmmeter reading.
本实用新型涉及一种半导体测试器件，尤其是半导体测试探针。
The utility model relates to a semiconductor test device, in particular to a semiconductor test probe.
在一个实施例中，绝缘套筒从测试探针延伸，并且围绕暴露的探针针尖的一部分。
In one embodiment, an insulative sleeve extends from the test probe and surrounds a portion of the exposed probe tip.
而且如果使用本半导体测试探针，由于针尾部的特殊结构，我们可以将整个针模组放入超声波清洗机中清洗。
Moreover, in order to clean the semiconductor test probe, the probe module group as a whole, due to the special structure of the tail part of the probe, can be placed into an ultrasonic cleaner.
而且如果使用本半导体测试探针，由于针尾部的特殊结构，我们可以将整个针模组放入超声波清洗机中清洗。
Moreover, in order to clean the semiconductor test probe, the probe module group as a whole, due to the special structure of the tail part of the probe, can be placed into an ultrasonic cleaner.
应用推荐