• 分辨电子显微镜晶体结构晶界位错晶体缺陷进行了观察与分析

    The crystal structure and some defects such as tilt boundary and dislocation of lanthanum chromates were investigated by high resolution microscopy (HERM).

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  • 应用X射线衍射仪分辨电子显微镜电子能量损失分析纳米线的微观结构。

    The nanowires were analyzed by X-ray diffraction, high resolution electron microscopy (HREM), electron energy loss spectroscopy.

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  • 应用X射线衍射仪分辨电子显微镜电子能量损失分析纳米线的微观结构。

    The nanowires were analyzed by X-ray diffraction, high resolution electron microscopy (HREM), electron energy loss spectroscopy.

    youdao

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