This paper compared the effect of AFM tip to the sample surface under different imaging modes.
本文进一步分析讨论这种现象产生的原因，对比了不同成像模式下afm针尖对样品表面的影响。
In the paper a kind of patterning method was studied with voltage applied between the AFM tip and sample with emphasis on its mechanism.
本文介绍了在AFM针尖与氢钝化硅表面之间施加电场作用对硅表面进行修饰的纳米加工方法，重点讨论了加工机理。
The results of experiments showed how the surface structure of lipid bilayer membrane could be created by the interaction between the AFM tip and lipid membrane.
实验结果表明，原子力显微镜的探针与脂双层膜的相互作用导致脂双层膜表面产生一个永久的损伤。
However, instead of heating the entire sample, the researchers used a hot atomic force microscope (AFM) tip to convert very narrow ribbons, measuring just 12 nm across, into reduced graphene.
然而，研究人员并非采用加热整个样本的方案，而是使用了原子力显微镜(afm)一个加热探针去转换出一条仅有12纳米宽的导电带。
The interaction forces between the tip and sample is used to acquire 3-dimentional image of the samples in atomic force microscopy(AFM).
原子力显微技术利用探针尖端与标本之间相互作用的力场对标本进行三维成像。
The interaction forces between the tip and sample is used to acquire 3-dimentional image of the samples in atomic force microscopy(AFM).
原子力显微技术利用探针尖端与标本之间相互作用的力场对标本进行三维成像。
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