In this paper, the theory and architecture of boundary scan test technology is introduced and researched, then its application is given.
研究了目前较常用的边界扫描测试技术的原理、结构，并给出了边界扫描技术的应用。
In the end, the boundary scan test technology is introduced as the useful complement to functional self-test method, which can improve the fault isolation rate.
最后介绍了边缘扫描测试技术，指出边缘扫描测试技术是功能自测试方法的有益补充，能够有效提高测试的故障隔离率。
With the continual improvement of the chip's integration level and complexity of print circuit board, the application of boundary scan test technology becomes wider and wider in testing ICs.
随着芯片集成度和印刷电路板复杂度的不断提高，边界扫描测试技术在芯片故障检测中的应用越来越广泛。
On the basis of mixed-signal Boundary scan technology, a scheme of mixed-signal Boundary-scan test system is presented and the hardwares are implemented, including the controller and display unit.
基于混合信号边界扫描技术标准，提出混合信号边界扫描控制器的设计方案并实现了其硬件设计，包括边界扫描控制模块、显示驱动模块等。
The paper proposes applying boundary-scan technology which is widely used in the domain of test to the computer hardware experiment to resolve the two crucial problems of configuration and test.
本文提出将测试领域成熟的边界扫描技术应用在实验系统中，解决配置和验证两大关键问题。
Meanwhile the testing of SOC become more difficult and complex, Boundary-Scan-based Built-in-Test technology give a new solution.
与此同时，片上系统的测试问题也随之产生，基于边界扫描的内建自测试技术为片上系统的测试提供了新的解决方案。
Meanwhile the testing of SOC become more difficult and complex, Boundary-Scan-based Built-in-Test technology give a new solution.
与此同时，片上系统的测试问题也随之产生，基于边界扫描的内建自测试技术为片上系统的测试提供了新的解决方案。
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