Aiming at the mixed-signal circuit testing, an integrated built-in self test (BIST) architecture for testing on-chip high speed ADC was presented.

针对混合信号电路的测试问题，提出了一种内建自测试(BIST)结构，分析并给出了如何利用该结构来计算片上高速模数转换器(adc)的静态参数。

youdao

Aiming at the mixed-signal circuit testing, an integrated built-in self test (BIST) architecture for testing on-chip high speed ADC was presented.

针对混合信号电路的测试问题，提出了一种内建自测试(BIST)结构，分析并给出了如何利用该结构来计算片上高速模数转换器(adc)的静态参数。

youdao