Micro cantilever probe of atomic force microscope (AFM) is a typical micro mechanical component, which is under a coupling deformation during the contact scanning process.
原子力显微镜（AFM）的微探针系统是典型的微机械构件，它在接触扫描过程处于耦合变形状态。
The film and its surface morphologies of amino-polysiloxane were observed and studied by means of atomic force probe microscopy(AFM) and contact angle measurement instrument.
应用原子力显微镜（AFM）和接触角测量仪对乙酸酐改性氨基聚硅氧烷的成膜性及膜形态进行了研究。
Numerical simulations of micro scanning forces and micro topography are presented to investigate the influence of the coupling deformation of AFM probe under the AFM contact mode.
采用数值模拟方法探究恒力模式下探针耦合变形对微观扫描力信号、微观形貌信号的影响。
Numerical simulations of micro scanning forces and micro topography are presented to investigate the influence of the coupling deformation of AFM probe under the AFM contact mode.
采用数值模拟方法探究恒力模式下探针耦合变形对微观扫描力信号、微观形貌信号的影响。
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