Numerical simulations of micro scanning forces and micro topography are presented to investigate the influence of the coupling deformation of AFM probe under the AFM contact mode.
采用数值模拟方法探究恒力模式下探针耦合变形对微观扫描力信号、微观形貌信号的影响。
Numerical simulations of micro scanning forces and micro topography are presented to investigate the influence of the coupling deformation of AFM probe under the AFM contact mode.
采用数值模拟方法探究恒力模式下探针耦合变形对微观扫描力信号、微观形貌信号的影响。
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