In this paper, a new method for testability of Dimming and Focusing Autonomous System in Electro-optic Theodolite is introduced, that is BIT (Build-in test).
本文对光电经纬仪的小系统测试性采用了新的方法，即采用机内测试来完成。
In this paper, a new method for testability of Dimming and Focusing Autonomous System in Electro-optic Theodolite is introduced, that is BIT (Build-in test).
本文对光电经纬仪的小系统测试性采用了新的方法，即采用机内测试来完成。
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