The recombination activity of grain boundaries (GBs) in casting multicrystalline silicon (mc-Si) was investigated through an electron beam induced current (EBIC) technique.
本文利用电子束诱生电流（EBIC）对铸造多晶硅中晶界的复合特性进行了研究。
The recombination activity of grain boundaries (GBs) in casting multicrystalline silicon (mc-Si) was investigated through an electron beam induced current (EBIC) technique.
本文利用电子束诱生电流（EBIC）对铸造多晶硅中晶界的复合特性进行了研究。
应用推荐