The coating composition, microstructure and phases were investigated by energy dispersive X ray analysis (EDXA), X ray diffraction(XRD), scanning electron microscope(SEM)and image analyzer.
运用能谱技术（EDXA）、X射线衍射仪（XRD）、扫描电子显微镜（SEM）和图像分析仪对涂层成分、显微组织、涂层相结构和组成进行了分析。
The resolution of the structure image so obtained may be higher than that of the original electron micrographs and may approach the diffraction limit.
所得结构图像的分辨本领将优于电子显微图，而有可能接近于衍射分辨极限。
The resolution of the structure image so obtained may be higher than that of the original electron micrographs and may approach the diffraction limit.
所得结构图像的分辨本领将优于电子显微图，而有可能接近于衍射分辨极限。
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