• The speciation of silver in the lead concentrates were analyzed by means of optical microscope and electron probe micro-analyser (EPMA).

    利用光学显微镜电子探针对铅精矿中银赋存状态进行了分析。

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  • The microstructures, inclusions and of steels before and after diffusion annealing was compared by means of microscope and electron probe micro-analyzer (EPMA).

    利用金相显微镜电子探针分析了扩散退火前后碳钢金相组织、夹杂物和磷偏析的变化情况。

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  • The present paper systematically checks and examines as well as analyzes causes to the cold-bended crack in the hot rolled steel plate Q345 by microscope, X-ray and Electron Probe Micro-analyzer.

    利用金相显微镜X射线衍射仪电子探针对Q 345热轧钢板因冷弯产生裂纹进行了系统检验分析

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  • The micro area analysis was accomplished by the help of electron probe.

    配合电子探针分析

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  • By using the adsorption of gas probe, we can understand the surface or interface electron character of functional semiconductor in micro-nano region in essentially from a new point of view.

    揭示了半导体表面城原子结构对其微纳区域表面界面电子特性影响,认识半导体微纳区域表面界面电子行为提供思路

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  • X ray images of electron probe were acquired by a micro computer, and observed in colors.

    应用微型计算机直接采集电子探针X射线像,并用伪彩色显示技术进行观察

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  • X ray images of electron probe were acquired by a micro computer, and observed in colors.

    应用微型计算机直接采集电子探针X射线像,并用伪彩色显示技术进行观察

    youdao

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