The structure and morphology ofthe coating film are studied by use of SEM andpolarized microscope.
用扫描电子显微镜及偏光显微镜观察涂膜的结构及形态。
The results show that the film, greatly different from conventional oxide films in composition, morphology and structure, is a novel aluminum oxide film.
结果表明，该膜层的成分、形貌及结构与常规氧化膜有很大的区别，是一种新型铝氧化膜。
The effects of the flow rate of oxygen and pulse bias voltage on the structure, deposition rate and the surface morphology of thin film were studied.
研究了氧流量和脉冲偏压对薄膜相结构、沉积速率、表面形貌、薄膜硬度的影响。
Film preparation conditions, film surface morphology and structure of the two kinds of materials are summarized.
总结了这两类材料的成膜条件、薄膜表面形态和结构以及它们的敏感特性。
The surface morphology and chemical structure of the film are characterized by Atomic Force Microscope (AFM) and Fourier Transform Infrared Spectroscope (FTIR).
并且分别利用原子力显微镜和傅立叶变换红外光谱对薄膜进行界面形态和微观结构分析。
The study of the thin-film structure and morphology during the thin-film growth has practical application in many areas, in particular in semiconductor industry.
薄膜生长过程中的结构和形态的研究在很多领域都有实际的应用，特别是在半导体制造领域。
The results show that the film surface morphology is reticular porous structure, at different time and termination voltage, there is large difference between membrane surface structure;
结果表明：膜层表面微观形貌呈网状多孔结构，不同时间和终止电压下，膜表层结构区别较大；
The structure, morphology, the element composition and its distribution on the surface of the composite film were then analyzed by means of XRD, om, SEM EDS and XPS.
利用XRD、OM、SEM、EDS和XPS分析了该复合薄膜的结构、表面形貌及表面元素的组成和分布，并通过紫外光照下甲基橙溶液的光催化降解反应分析了薄膜的光催化活性。
Structure characterization and film morphology of polyether/UV-absorbing groups containing polysiloxane;
利用红外光谱及核磁共振法表征了双烷基聚醚的端基结构。
Structure characterization and film morphology of polyether/UV-absorbing groups containing polysiloxane;
利用红外光谱及核磁共振法表征了双烷基聚醚的端基结构。
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