The change of narrow defect mode under gradual changes of incident Angle is studied by use of eigen matrix.

用特征矩阵法研究了窄带缺陷模在入射角缓慢变化中的变化规律。

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The change of narrow defect mode under gradual changes of incident Angle is studied by use of eigen matrix.

用特征矩阵法研究了窄带缺陷模在入射角缓慢变化中的变化规律。

youdao