The growth process of the films was in situ monitored by reflective high energy electron diffraction (RHEED).
通过反射高能电子衍射(RHEED)仪原位实时监测薄膜生长，研究薄膜的生长过程。
The microstructure of multilayers was characterized by high-resolution transmission electron microscopy, X-ray diffraction, scanning electron microscope and energy dispersive spectrometer.
利用透射电子显微镜、X射线衍射仪、扫描电子显微镜和X射线能量色散谱仪分析了多层膜的微结构。
Surface damage caused by cutting on Si, InSb, HgCdTe has been studied by Reflection High Energy Electron Diffraction (RHEED) after step-etching the samples.
利用高能反射电子衍射技术（RHEED），研究了硅、锑化铟、碲镉汞样品逐次化学腐蚀后的切割表面损伤。
The nanowires were analyzed by X-ray diffraction, high resolution electron microscopy (HREM), electron energy loss spectroscopy.
应用X射线衍射仪、高分辨电子显微镜和电子能量损失谱分析了纳米线的微观结构。
The growth process of the films was in situ monitored by reflective high energy electron diffraction(RHEED).
通过反射高能电子衍射 （RHEED）仪原位实时监测薄膜生长 ，研究薄膜的生长过程。
Reflection High Energy Electron Diffraction (RHEED);
反射式高能电子衍射；
Reflection High Energy Electron Diffraction (RHEED);
反射式高能电子衍射；
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