A new structure of polarized light interference interleaver is presented.
提出了一种偏振光干涉型光交错复用器的新结构。
These devices can not only accomplish polarized light interference experiment, but also measure the refractivity or refractive index profile of crystal.
经过分析，该装置不仅能完成偏振光的干涉实验，而且可以测定晶体的折射率或折射率分布情况。
Changes of light polarization in each interface are analyzed and the method to calculate total amplitude in convergent polarized light interference is proposed.
分析了光波在各界面折射时偏振态的变化，提出了会聚偏光干涉合成振幅的计算方法。
Many important information of a crystal is included in the convergent polarized light interference pattern, and can be completely utilized by numerical analysis of the pattern.
晶体会聚偏光干涉图包含了晶体特性的许多信息，建立偏光干涉图的定量分析方法可以使这些信息得到充分利用。
Many important information of a crystal is included in the convergent polarized light interference pattern, and can be completely utilized by numerical analysis of the pattern.
晶体会聚偏光干涉图包含了晶体特性的许多信息，建立偏光干涉图的定量分析方法可以使这些信息得到充分利用。
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