The X-ray diffraction (XRD), excitation, emission and phonon side band spectra of the upper and lower parts of crystals were measured.
测定了晶体下部与上部的X射线衍射图（XRD）、激发光谱、荧光光谱以及声子边带谱。
The X-ray diffraction (XRD), excitation, emission and phonon side band spectra of the upper and lower parts of crystals were measured.
测定了晶体下部与上部的X射线衍射图（XRD）、激发光谱、荧光光谱以及声子边带谱。
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