It can satisfy the requirement of digital plugboard test and carry out the plugboards test to chip level. Thus it has wide application potential.
它满足雷达数字插件板测试需求，能实现芯片级测试，具有广阔的应用前景。
A kind of chip-level test controller which can flexibly carry out the result of test scheduling is presented, which also takes chip test scheduling into account.
本文首次将测试调度问题与芯片级测试控制器设计问题结合起来，提出了一种能够灵活实现各种测试调度结果的芯片级测试控制器设计。
Under each test mode, function and power consume of the chip is simulated, and the result is given out.
在对系统各模块的结构和功能进行分析基础上，在测试模式下，对系统功能、功耗进行了仿真模拟。
Under each test mode, function and power consume of the chip is simulated, and the result is given out.
在对系统各模块的结构和功能进行分析基础上，在测试模式下，对系统功能、功耗进行了仿真模拟。
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