It is a crucial step for destructive physical analysis (DPA) and failure analysis (fa) to remove the plastic package for the die exposing.
去除塑料包封层,露出芯片表面,是DPA(破坏性物理分析)及FA(失效分析)的关键一步。
It is a crucial step for destructive physical analysis (DPA) and failure analysis (fa) to remove the plastic package for the die exposing.
去除塑料包封层,露出芯片表面,是DPA(破坏性物理分析)及FA(失效分析)的关键一步。
应用推荐