The dependence of etching rate and profile on the vacuum pressure, RF pow-er, gas composition and flow rate, and electrode temperature is analyzed.
分析了真空压力、射频功率、气体组合及其流量和电极温度对刻蚀速率、刻蚀剖面的影响；
The influence of chamber pressure, gas flow rate and RF power on micro loading effect in reactive ion etch of silicon dioxide is researched.
对二氧化硅反应离子刻蚀中反应室压力，刻蚀气体流量和射频功率等因素对刻蚀速率和刻蚀均匀性的影响进行了研究。
It is proved that the uniformity of etch rate can be improved and the effect of micro load can be decreased by adjusting the value of chamber pressure, gas flow rate and RF power properly.
结果表明，通过对反应室压力、刻蚀气体流量和射频功率的调节，可以降低微负载效应的影响，得到良好的刻蚀均匀性。
Oxide ion yield of the rare earth elements (REE) decreased with the increasing of RF power and the sampling depth, or with the decreasing of carrier gas flow rate.
稀土元素的氧化物离子产率随入射功率和采样深度增加，载气流速减小而降低。
Oxide ion yield of the rare earth elements (REE) decreased with the increasing of RF power and the sampling depth, or with the decreasing of carrier gas flow rate.
稀土元素的氧化物离子产率随入射功率和采样深度增加，载气流速减小而降低。
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