Several quantitative drift measurement techniques for scanning probe microscopy (SPM) were introduced. A new method using two-dimensional zero-reference masks was proposed to measure the SPM drift.
对扫描探针显微镜(SPM)仪器漂移的定量测量的几种方法进行探讨，提出应用二维零位标记进行漂移测量。
Carbon nanotube has been expected to be a suitable material to the apex of scanning probe microscopy (SPM) tips because of its unique physical properties and special structures.
碳纳米管由于特殊的空间结构和突出的物理性能而广泛用于各类扫描探针显微镜。
Carbon nanotube has been expected to be a suitable material to the apex of scanning probe microscopy (SPM) tips because of its unique physical properties and special structures.
碳纳米管由于特殊的空间结构和突出的物理性能而广泛用于各类扫描探针显微镜。
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