The selected area electron diffraction (SAED) pattern of the twin was indexed by transforming matrix of hexagon crystal twin plan.
并采用六方晶系孪晶面的变换矩阵对孪晶电子衍射花样进行了标定。
The X-ray diffraction (XRD), high-resolution transmission electron microscopy (HRTEM) and selected area electron diffraction (SAED) results indicate that the sputtered film has an amorphous structure.
射线衍射(XRD)、高分辨率透射电镜(HRTEM)和选区电子衍射(SAED)分析表明，该薄膜为非晶态。
The X-ray diffraction (XRD), high-resolution transmission electron microscopy (HRTEM) and selected area electron diffraction (SAED) results indicate that the sputtered film has an amorphous structure.
射线衍射(XRD)、高分辨率透射电镜(HRTEM)和选区电子衍射(SAED)分析表明，该薄膜为非晶态。
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