The technique of coupling ultraviolet photoelectron spectroscopy (UPS) with time-of-flight mass spectrometry (TOFMS) is described.
本文报道了将紫外光电子能谱(ups)和飞行时间质谱(TOFMS)相结合的技术。
Time-of-Flight secondary ion mass spectrometry (TOF-SIMS) is a very sensitive surface analytical technique, well established for many industrial and research applications.
飞行时间二次离子质谱（TOF- SIMS）是一种非常灵敏的表面检测技术。
Time-of-Flight secondary ion mass spectrometry (TOF-SIMS) is a very sensitive surface analytical technique, well established for many industrial and research applications.
飞行时间二次离子质谱（TOF- SIMS）是一种非常灵敏的表面检测技术。
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