This paper introduces the background of using Wafer Level Reliability technology, and expounds the characteristics and functions in details.
介绍了圆片级可靠性技术产生的背景，对其特点和作用作了详细的论述。
The prober is necessary role in wafer-level analysis of reliability.
在晶圆形式可靠度分析中，承载晶圆的探针台是不可或缺的。
The prober is necessary role in wafer-level analysis of reliability.
在晶圆形式可靠度分析中，承载晶圆的探针台是不可或缺的。
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