They have been characterized respectively by transition electronic microscope (TEM), X-ray powder diffraction (XRD), field induced surface photovoltage spectrum (FISPS).
对其进行了透射电镜(tem)、X射线粉末衍射(XRD)，场诱导表面光电压谱表征(FISPS)。
They have been characterized respectively by transition electronic microscope (TEM), X-ray powder diffraction (XRD), field induced surface photovoltage spectrum (FISPS).
对其进行了透射电镜(tem)、X射线粉末衍射(XRD)，场诱导表面光电压谱表征(FISPS)。
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