Atomic absorption spectrometry (AAS), scanning electron microscopy (SEM), and energy dispersive X-ray spectrometry (EDXS) are carried out to characterize the deposition on fiber probe.
通过使用原子吸收光谱仪，扫描显微镜和能量色散X射线谱仪对覆膜光纤探针进行表征。
The microstructure and properties of the composite coatings were investigated by optical microscopy, X-ray diffractometer, electron probe microanalyzer and a skimming wear machine.
利用金相显微镜、X射线衍射仪、电子探针及滑动磨损试验机，研究了合金熔覆层的显微组织及性能。
The distributions of composition, phase-and microstructure were examined respectively by using electron probe microanalysis (EPMA), X-ray Diffraction (XRD) and scanning electron microscopy (SEM).
分别用电子探针（EPMA）、X衍射（XRD）和扫描电镜（SEM）查证了其组分、相结构和显微结构的梯度分布。
The problem of wavelength resolution of X-ray spectrometer of the electron probe is discussed.
讨论了电子探针中X光分光谱仪的波长分辨力。
The present paper systematically checks and examines as well as analyzes causes to the cold-bended crack in the hot rolled steel plate Q345 by microscope, X-ray and Electron Probe Micro-analyzer.
利用金相显微镜、X射线衍射仪及电子探针等对Q 345热轧钢板因冷弯产生的裂纹进行了系统检验分析。
X ray images of electron probe were acquired by a micro computer, and observed in colors.
应用微型计算机直接采集电子探针X射线像，并用伪彩色显示技术进行观察。
The distribution of silicon in as-cast white iron was studied using electron probe microanalysis. Effect of silicon on lattice constant of the cementite was also studied using X-ray diffraction.
采用电子探针及X射线衍射仪测定了可锻铸铁白口组织中硅的分布和硅对渗碳体点阵参数的影响。
Results: SEM showed that nano TiO2 and nano ZrO2 were distributed into dental composite resin evenly and X ray electron probe showed the components of nano materials were 8.59% and 7.55% respectively.
结果：扫描电镜显示纳米二氧化钛和纳米二氧化锆均匀分布在牙科复合树脂中，X -线能谱分析显示纳米材料含量分别为8.59%和7.55%。
Phases constitution, microstructure and element distribution of the coating were studied by X-ray diffraction(XRD), scanning electron microscope(SEM) and electron probe microanalysis(EPMA).
通过X射线衍射分析（XRD）、扫描电镜（SEM）等观察分析了复合粉涂层表面形貌，分析了表面微裂纹和孔隙的形成过程。
Phases constitution, microstructure and element distribution of the coating were studied by X-ray diffraction(XRD), scanning electron microscope(SEM) and electron probe microanalysis(EPMA).
通过X射线衍射分析（XRD）、扫描电镜（SEM）等观察分析了复合粉涂层表面形貌，分析了表面微裂纹和孔隙的形成过程。
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