The surface morphology and the component of the film has been analyzed by scanning electron microscopy (SEM) and X-ray photoelectron spectrometer (XPS).
并利用扫描电子显微镜(sem)和x -射线光电子谱(XPS)对薄膜的形貌和组分进行了表征。
Detective efficiency is an important instrumental parameter of X ray photoelectron spectrometer.
探测效率是X射线光电子能谱仪一个很重要的仪器参数。
The implanted samples were analyzed using X ray diffractometer (XRD) and X ray photoelectron spectrometer (XPS).
注入后的样品用X射线衍射方法(XRD)以及光电子能谱方法(XPS)进行分析。
The implanted samples were analyzed using X ray diffractometer (XRD) and X ray photoelectron spectrometer (XPS).
注入后的样品用X射线衍射方法(XRD)以及光电子能谱方法(XPS)进行分析。
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