The coating composition, microstructure and phases were investigated by energy dispersive X ray analysis (EDXA), X ray diffraction(XRD), scanning electron microscope(SEM)and image analyzer.
运用能谱技术（EDXA）、X射线衍射仪（XRD）、扫描电子显微镜（SEM）和图像分析仪对涂层成分、显微组织、涂层相结构和组成进行了分析。
Then, the films were characterized with X ray photoelectron spectroscopy(XPS), X ray diffraction(XRD), ultraviolet visible light absorption spectroscopy, and atomic force microscopy(AFM).
用X光电子能谱、X射线衍射、紫外可见吸收光谱、原子力显微镜等手段对制备的薄膜进行了表征。
The samples were characterized by X-ray diffraction (XRD), Scanning electronic microscope (SEM), photoluminescence (PL) and X-ray excited luminescence (XEL) spectra.
分别以X-射线衍射（XRD）、扫描电子显微镜（SEM）、光致发光（PL）光谱及X-射线激发的发光（XEL）光谱对样品进行了表征。
The x-ray diffraction (XRD), x-ray photoelectron spectroscopy (XPS)and scanning electronic microscopy (SEM)were employed to analyze the structure, composition and surface morphology of the films .
用x射线衍射（XRD）、扫描电镜（SEM）和x光电子能谱（XPS）对样品进行了结构、形貌及组分分析。
The prepared product was characterized by X-ray diffraction (XRD), scanning electron microscopy (SEM), transmission electron microscope (TEM) and X-ray photoelectron spectroscopy (XPS).
利用X射线衍射(XRD)、扫描电镜(sem)、透射电镜(tem)和X射线光电子能谱(XPS)对制备的产品进行了表征。
The obtained products were characterized by X-ray powder diffraction (XRD), X-ray photoelectron spectroscopy (XPS), and scanning electron microscopy (SEM).
合成产物用粉未衍射（XRD）X-射线光电子能谱（XPS）和扫描电子显微（SEM）表征。
The composition of the particles has been determined by X-ray diffraction (XRD) and energy dispersive X-ray spectroscopy (EDX).
这种颗粒的组成可以由x射线衍射(XRD)和x射线能量谱(EDX)检测。
The X-ray powder diffraction (XRD), field emission scanning electron microscopy (FE-SEM) and energy dispersive X-ray spectrometer (EDX) were used to characterize the products.
用X射线粉末衍射仪(XRD)、场发射扫描电镜(FE - sem)和X射线能谱仪(EDX)对产物进行了表征。
The coating phase structure and chemical composition were analyzed by X-ray Diffraction (XRD) and X-ray Photoelectron Spectroscopy (XPS) respectively;
利用X射线衍射仪、X射线光电子能谱仪（XPS）对涂层的相结构及涂层的化学成分进行了分析和讨论；
The coating phase structure and chemical composition were analyzed by X-ray Diffraction (XRD) and X-ray Photoelectron Spectroscopy (XPS) respectively;
利用X射线衍射仪、X射线光电子能谱仪（XPS）对涂层的相结构及涂层的化学成分进行了分析和讨论；
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