Field emission scanning electron microscopy images show that the SiC flower-like structures deposited by irregular hexagon.
场发射扫描电镜照片显示碳化硅主要有不规则的六角片堆积而成花状结构。
The X-ray powder diffraction (XRD), field emission scanning electron microscopy (FE-SEM) and energy dispersive X-ray spectrometer (EDX) were used to characterize the products.
用X射线粉末衍射仪(XRD)、场发射扫描电镜(FE - sem)和X射线能谱仪(EDX)对产物进行了表征。
The structures of the composite films were characterized by field emission scanning electron microscopy (FESEM), Fourier transform infrared spectroscopy (FTIR) and thermo gravimetric analysis (TGA).
采用场发射扫描电镜(FESEM)、红外光谱(FTIR)、热重分析(TGA)等方法对复合膜结构进行表征。
The samples were characterized by field-emission scanning electron microscopy (SEM), energy dispersive X-ray spectroscopy(EDS) and photoluminescence (PL).
通过扫描电子显微镜（SEM）、能谱分析仪（EDS）和光致发光（PL）测试对样品进行了表征。
The obtained products were characterized by powder X-ray diffraction (XRD), scanning electron microscopy (SEM), and field-emission scanning electron microscopy (FE-SEM).
利用粉末X射线衍射（XRD）、扫描电镜（SEM）和场发射扫描电镜（FE-SEM）对所得产物进行表征。
The obtained products were characterized by powder X-ray diffraction (XRD), scanning electron microscopy (SEM), and field-emission scanning electron microscopy (FE-SEM).
利用粉末X射线衍射（XRD）、扫描电镜（SEM）和场发射扫描电镜（FE-SEM）对所得产物进行表征。
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