Measurement of coating thickness in the proof-test of IC packages and metal cases using X-Ray Fluorescence (XRF) spectrometry is described.
介绍了在外壳检验中，应用X射线荧光光谱法（XRF），对外壳的镀涂层厚度进行测试；
It is very suitable for the on-line detection and real-time monitoring in coating industries, particularly for the thickness measurement of weak absorption ultra-thin films.
它非常简单、快捷，特别适用于镀膜行业的在线检测和实时监控，尤其是弱吸收材料超薄膜的厚度测量。
It is mainly used in the thickness measurement of nonmetal coating mantled on metallic substance. At the same time the sensor can meet the high precision non-contact request in industrial measurement.
并且能够满足工业自动检测中高精度和非接触测量要求，同时测量范围和精度可随不同的应用要求而进行大范围的调整。
It is mainly used in the thickness measurement of nonmetal coating mantled on metallic substance. At the same time the sensor can meet the high precision non-contact request in industrial measurement.
并且能够满足工业自动检测中高精度和非接触测量要求，同时测量范围和精度可随不同的应用要求而进行大范围的调整。
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