This paper include the establishment of the quiet zone of microwave anechoic chamber, the evaluation of the systems 'measurement uncertainty and the research of TIS fast-measuring technique.
本论文主要包括微波暗室静区的确立，测试系统的测量不确定度评定以及TIS快速测试技术的研究三个部分。
A novel method for quick measurement of moisture in aluminum oxide by means of microwave technique was investigated, while the diverse results of moisture content were analyzed and discussed.
利用微波技术快速测定氧化铝物料的水分，同时对不同含水量的检测结果进行了分析和讨论。
Microwave measurement is an important part in microwave technique. It directly influences the design quality of microwave systems and devices.
微波测量是微波领域的重要方面，它直接关系到设计的微波系统和微波器件性能的好坏。
We present an on-wafer measurement technique of semiconductor wafer using special coplanar microwave probes.
本文描述了使用共面微波探针的半导体芯片在片测试技术。
We present an on-wafer measurement technique of semiconductor wafer using special coplanar microwave probes.
本文描述了使用共面微波探针的半导体芯片在片测试技术。
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