Changes in surface roughness after gas cluster ion bombardments have been measured by an atomic force microscope.
用原子力显微镜测量了气体离化团束照射后表面粗糙度的变化。
The theory of measuring surface roughness by using light-section microscope is described, and a simple method to measure the Angle of complicated small-scale tool is introduced.
阐述了光切显微镜测量表面粗糙度的原理以及如何利用该原理测量小尺寸复杂刀具角度的方法。
With the help of the atom force microscope (AFM), we observed the junction surfaces and found that there exists semisphere-formed roughness in regular arrangement on the surface.
利用原子力显微镜(afm)观察MIM隧道结的表面形貌，发现结表面存在规则有序的自然粗糙度。
From scanning electron microscope (SEM) and (AFM) atomic force microscope images, it is observed that both grain size and surface roughness are aggrandized greatly after annealing.
从扫描电子显微镜(sem)和原子力显微镜(afm)图像可以观察到，薄膜在退火后其晶粒尺寸和粗糙度都大大增加。
From scanning electron microscope (SEM) and (AFM) atomic force microscope images, it is observed that both grain size and surface roughness are aggrandized greatly after annealing.
从扫描电子显微镜(sem)和原子力显微镜(afm)图像可以观察到，薄膜在退火后其晶粒尺寸和粗糙度都大大增加。
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