In this paper, modularization is used to study the design and development of an inspection system for generalized defects on an optical surface.
论文采用模块化方法对光学元件表面广义疵病检测装置设计开发过程展开研究。
In this paper, modularization is used to study the design and development of an inspection system for generalized defects on an optical surface.
论文采用模块化方法对光学元件表面广义疵病检测装置设计开发过程展开研究。
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