The device treated by the process is of small loss of drain radio-frequency current and increased electric breakdown strength of device as well as delivered power.
经过这样处理后的器件，漏极射频电流损失小，器件击穿电压和输出功率得以提高。
The device treated by the process is of small loss of drain radio-frequency current and increased electric breakdown strength of device as well as delivered power.
经过这样处理后的器件，漏极射频电流损失小，器件击穿电压和输出功率得以提高。
应用推荐