So the capacitance metrology technology in high frequency cannot meet the need of testing for impedance metrology standards and the measurement instruments.
为了建立和完善国家现代电学计量标准中扩展频段电容标准和检测体系，中国计量科学研究院立项进行“电容扩频”技术的研究。
The principle of MOS capacitance measurement based on the method of high frequency detection is presented.
MOS结构高频C-V（电容-电压）特性测量是检测MOS器件制作工艺的重要手段。
The principle of MOS capacitance measurement based on the method of high frequency detection is presented.
MOS结构高频C-V（电容-电压）特性测量是检测MOS器件制作工艺的重要手段。
应用推荐