The microstructure of multilayers was characterized by high-resolution transmission electron microscopy, X-ray diffraction, scanning electron microscope and energy dispersive spectrometer.
利用透射电子显微镜、X射线衍射仪、扫描电子显微镜和X射线能量色散谱仪分析了多层膜的微结构。
The crystal structure and morphology of the as-synthesized product were characterized by X-ray diffractometer, scanning electron microscope and high-resolution transmission electron microscope.
利用X射线衍射仪、扫描电子显微镜和高分辨透射电子显微镜对所得产物的晶体结构和形貌进行了表征。
The crystal structure and morphology of the as-synthesized product were characterized by X-ray diffractometer, scanning electron microscope and high-resolution transmission electron microscope.
利用X射线衍射仪、扫描电子显微镜和高分辨透射电子显微镜对所得产物的晶体结构和形貌进行了表征。
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