Substituting the electric field distributions into the formula we ve induced, we got the trapped charge distribution inside the buried oxide during total irradiation under different bias states.
通过对载流子扩散机理的研究,由数学公式的推导,得到陷阱电荷分布随电场变化的函数关系。
Substituting the electric field distributions into the formula we ve induced, we got the trapped charge distribution inside the buried oxide during total irradiation under different bias states.
通过对载流子扩散机理的研究,由数学公式的推导,得到陷阱电荷分布随电场变化的函数关系。
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