The chemical structures of the films which are prepared under different conditions are analyzed with X-ray photoemission spectroscopy.
利用X射线光电子能谱来探测不同制备条件下薄膜样品的化学结构。
The chemical structures of the films which are prepared under different conditions are analyzed with X-ray photoemission spectroscopy.
利用X射线光电子能谱来探测不同制备条件下薄膜样品的化学结构。
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