Testing based on stuck-at fault model is insufficient for high performance ICs, especially for CMOS circuits.
基于固定型故障模型的测试方法已不能满足高性能集成电路，尤其是对CMOS电路的测试要求。
The electric locomotive bang-bang circuit is converted into an equivalent digitalcombinational logic circuit for setting up its stuck-at fault model.
本文将机车继电器控制电路等效为数字组合逻辑电路，建立了它的固定故障等效模型。
The electric locomotive bang-bang circuit is converted into an equivalent digitalcombinational logic circuit for setting up its stuck-at fault model.
本文将机车继电器控制电路等效为数字组合逻辑电路，建立了它的固定故障等效模型。
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