There will be an antinomy among sample frequency, memory capacitance and the width of window of sample time for developing the resolving power of LA while we taking the LA to test an digital system.
在用逻辑分析仪测试数字系统时，为了提高逻辑分析仪的分辨力，会产生采样频率、存储容量与采样时间窗口宽度之间的矛盾。
There will be an antinomy among sample frequency, memory capacitance and the width of window of sample time for developing the resolving power of LA while we taking the LA to test an digital system.
在用逻辑分析仪测试数字系统时，为了提高逻辑分析仪的分辨力，会产生采样频率、存储容量与采样时间窗口宽度之间的矛盾。
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