An optical method was introduced for measuring the thickness of solid thin films.
介绍了一种测量固体薄膜厚度的光学方法。
Some optical methods for measuring the thickness of the thin solid films are presented.
介绍了测量固体薄膜厚度的光学方法。
A method for determining both the optical constants and the thickness of thin films from transmission spectrum has been presented.
给出了确定透明均匀薄膜光学常数和厚度的方法。
A method for determining both the optical constants and the thickness of thin films from transmission spectrum has been presented.
给出了确定透明均匀薄膜光学常数和厚度的方法。
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