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  • The order thin films were characterized by using ultraviolet-visible absorption spectrometry, contact Angle measurement and atomic force microscopy.

    用紫外-可见吸收光谱仪、接触角测量仪、原子力显微镜对所制备的有序薄膜进行了表征。

    youdao

  • The order thin films were characterized by using ultraviolet-visible absorption spectrometry, contact Angle measurement and atomic force microscopy.

    用紫外-可见吸收光谱仪、接触角测量仪、原子力显微镜对所制备的有序薄膜进行了表征。

    youdao

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