This article explains how you can capture the problems view and the error log of the application under test, filter them, and customize them to determine problems and identify defects.
本文向您解释了，怎样获得问题视图以及测试程序的错误日志，怎样筛选它们，以及定制它们以决定问题和分析缺陷。
The Capture Screenshot error log view context menu provides a new work item action to create a new work item based on the selected error log line.
Error log视图上下文菜单提供了NewWorkItem操作，以基于所选的错误日志行创建新工作物件。
You can also create a custom appender (handler) to send events to the "Error Log" view and another to send it to the plug-in state location.
您还可以创建一个定制的appender(处理程序)将事件发送给“Error Log ”视图，再创建一个将事件发送到插件所在的位置。
Eclipse provides a graphical view of the error log as well, from the error log view, which can be found under the PDE Runtime view category.
Eclipse还从Error log视图提供了错误日志的图形视图，Error log视图可以在PDERuntime视图类别下找到。
Any exceptions reported during runtime are stacked in the Error log view (log file of the workspace).
运行时所报告的所有例外情况都存储在Error Log(工作区的日志文件)视图中。
If an error prevents a refactoring operation from completing, information about the error is written to the application event log, where any user who has "Normal user" permissions can view it.
如果因出错而无法完成重构操作，则有关该错误的信息将写入应用程序事件日志中，对此应用程序事件日志拥有“普通用户”权限的任何用户都可以查看该信息。
If an error prevents a refactoring operation from completing, information about the error is written to the application event log, where any user who has "Normal user" permissions can view it.
如果因出错而无法完成重构操作，则有关该错误的信息将写入应用程序事件日志中，对此应用程序事件日志拥有“普通用户”权限的任何用户都可以查看该信息。
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