原子力显微镜拍摄的17个忆阻器构成电路的图像。
An image of a circuit with 17 memristors captured by an atomic force microscope.
用X射线和原子力显微镜对其进行了表征。
The samples were characterized by the X-ray and Atom Force Microscope.
该系统可应用于多种相关原子力显微镜设备。
The system can be combined with a variety of atomic force microscope.
单分子力谱是基于原子力显微镜力的测量方法。
Single molecule force spectroscopy (SMFS) is a force measurement based on AFM.
利用原子力显微镜加工超快光导开关器件原型。
The prototype of the ultrafast photoconductive switch is fabricated using AFM.
采用原子力显微镜及透射电镜直接观测分子形貌。
The molecular morphology was observed directly by atom force microscope (AFM) and transmission electron microscope (TEM).
最后给出原子力显微镜和磁性显微镜的工作原理。
At last, the principle of the AFM and MFM are also presented.
原子力显微镜扫描对醛基化玻片表面形貌进行分析。
Scanning aldehyde group glass slide by atomic force microscopy study the surface shape.
用原子力显微镜作为测量工具，获取表面形貌数据。
And the surface texture data by atomic force microscope (AFM) are obtained.
从而提高了原子力显微镜的动态力灵敏度和分辨力。
Therefore the dynamic force sensitivity and the resolution of a conventional AFM are improved.
用原子力显微镜（AFM）研究了剪切带的三维形貌。
Three-dimension pattern of shear bands was investigated using atom force microscopy(AFM).
原子力显微镜(afm)是目前最新的生物成像技术之一。
Atomic force microscope (AFM) is one of the newest imaging techniques in the field of biomedicine.
光杠杆法是原子力显微镜(afm)悬臂定位的主要方法。
Optical lever method is a main technique to detect the cantilever's position in atomic force microscope (AFM).
方法应用原子力显微镜，对U251胶质瘤细胞系进行观测。
Methods T he cultured U251 glioma cell line was detected with atomic force microscope(AFM) .
这种原子力显微镜能够扫描象100纳米一样小的颗粒的形状。
The atomic force microscope can detail the shapes of particles as small as about 100 nanometers.
随着原子力显微镜的诞生，使高分子单链的界面研究成为可能。
With the emersion of atomic force microscope, the study of single macromolecular chain at interfaces becomes possible.
用原子力显微镜(afm)观察线性DNA并探讨其成像条件。
To observe linear DNA with atomic force microscope (AFM) and investigate the imaging conditions.
用原子力显微镜测量了气体离化团束照射后表面粗糙度的变化。
Changes in surface roughness after gas cluster ion bombardments have been measured by an atomic force microscope.
原子力显微镜(afm)是进行纳米测量和操作的一种主要工具。
Atomic Force Microscopy (AFM) is a main instrument for nano-scale measurement and manipulation.
超薄切片机可以制备用于原子力显微镜研究的纳米片层和新鲜表面。
Ultramicrotome makes nanoslices of a sample and a freshly cut surface is then measured by AFM.
本文针对原子力显微镜系统，提出了一种基于学习控制的快速扫描模式。
This paper proposes a learning control based high-speed scanning mode for an AFM system.
原子力显微镜(afm)是近十几年来表面成像技术中最重要的进展之一。
AFM is the foremost development on the image technique of the surface in near ten years.
在轻敲工作模式下，原子力显微镜（AFM）压电微悬臂以较大的振幅振动。
Working at tapping mode, atomic force microscope(AFM) piezoelectric microcantilever vibrates with large amplitude.
原子力显微镜(afm)是研究DNA有力工具，在对DNA研究中有其独特优势。
Atomic force microscope (AFM) is a powerful tool in DNA research, in has its unique superiority in DNA research.
简要介绍了原子力显微镜这一新型表面测试技术在猪皮胶原精细结构研究中的应用方法。
The usage of AFM(atomic force microscope), which is a new method of surface test, in studying the fine structure of natural pig collagen was discussed.
文中对原子力显微镜(afm)电场诱导硅氧化结构的部分形状特征进行了分析和讨论。
This paper analyzes and discusses some structure's features on the surface of silicon by atomic force microscope (AFM) electrical field induced oxidation.
设计方案对扫描器的负载能力要求不高，而且能使原子力显微镜实现较大范围的针尖扫描。
This design not only can realize large range scanning of AFM, but also does not request the high load ability of the scanner.
综述了近年来原子力显微镜在合成膜表征中的应用，对其中几个重要方面进行了举例介绍。
This paper overviews some recent applications of AFM in characterization of synthetic membranes with emphasizing several important aspects by giving many examples.
列维和他的同事们用原子力显微镜和两片绝缘体（镧氧化铝和锶钛氧化物），研制出了一枚纳米晶体管。
Using an atomic force microscope and two layers of insulators (lanthanum aluminum oxide and strontium titanium oxide), Levy and his colleagues created a nanoscale transistor.
列维和他的同事们用原子力显微镜和两片绝缘体（镧氧化铝和锶钛氧化物），研制出了一枚纳米晶体管。
Using an atomic force microscope and two layers of insulators (lanthanum aluminum oxide and strontium titanium oxide), Levy and his colleagues created a nanoscale transistor.
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