原子力显微镜是运用一种微小的探针去“感受”样本表面，能得到高分辨率的影像（约5纳米的分辨率）。
Atomic force microscopy generates very high-resolution images (about 5-nanometer resolution) by “feeling” the surface of a sample with a tiny probe tip.
然而，研究人员并非采用加热整个样本的方案，而是使用了原子力显微镜(afm)一个加热探针去转换出一条仅有12纳米宽的导电带。
However, instead of heating the entire sample, the researchers used a hot atomic force microscope (AFM) tip to convert very narrow ribbons, measuring just 12 nm across, into reduced graphene.
利用原子力显微镜、二次离子质谱分析仪和探针，对多晶硅薄膜的高温退火特性进行了实验研究。
An experiment was conducted to study the high-temperature annealing characteristics of polysilicon films using atomic force microscope, secondary ion mass spectroscopy and probe.
原子力显微镜（AFM）的微探针系统是典型的微机械构件，它在接触扫描过程处于耦合变形状态。
Micro cantilever probe of atomic force microscope (AFM) is a typical micro mechanical component, which is under a coupling deformation during the contact scanning process.
实验结果表明，原子力显微镜的探针与脂双层膜的相互作用导致脂双层膜表面产生一个永久的损伤。
The results of experiments showed how the surface structure of lipid bilayer membrane could be created by the interaction between the AFM tip and lipid membrane.
在扫描探针纳米加工技术的基础上，提出了利用原子力显微镜（AFM）来制作高频光栅的新工艺。
On the basis of micro-fabrication technique using the atomic force microscope, a new method was proposed for producing high frequency grating.
在扫描探针纳米加工技术的基础上，提出了利用原子力显微镜（AFM）来制作高频光栅的新工艺。
On the basis of micro-fabrication technique using the atomic force microscope, a new method was proposed for producing high frequency grating.
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