利用电子束离子源（EBIS）或者电子束离子陷阱（EBIT）产生的慢速高电荷态重离子束轰击金属靶面，离子束与靶面作用并复合辐射特征X射线；
The electron beam ion trap(EBIT) and the electron ion source(EBIS) are new instruments for the study of X-ray produced by very highly-charged ions when they interact with free electrons.
电子轰击存贮型脉冲离子源是为高分辨率、高灵敏度飞行时间质谱仪设计的新型离子源。
A new electron impact storage ion source has been designed for time of flight mass spectrometers with a high mass resolving power and high sensitivity.
本文报道一种由电子轰击型离子源、扇形磁分析器与法拉第筒式离子检测器组成的小型质谱计，介绍其设计参数、结构与性能。
This paper report the design parameters, construction and specificity of a small magnetic mass spectrometer with an EI ion source, a sector magnetic analyser and a Faraday cup ion detector.
本文报道一种由电子轰击型离子源、扇形磁分析器与法拉第筒式离子检测器组成的小型质谱计，介绍其设计参数、结构与性能。
This paper report the design parameters, construction and specificity of a small magnetic mass spectrometer with an EI ion source, a sector magnetic analyser and a Faraday cup ion detector.
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