红外瞄准镜环境温度冲击和不合理的温度变化将会诱发一系列的控制电路问题，如呈现局部过热，引起芯片结区烧毁；
Infrared Sight and unreasonable impact on the ambient temperature the temperature change will induce a series of control circuits such as rendering local overheating causing chip junction area burned;
红外瞄准镜环境温度冲击和不合理的温度变化将会诱发一系列的控制电路问题，如呈现局部过热，引起芯片结区烧毁；
Infrared Sight and unreasonable impact on the ambient temperature the temperature change will induce a series of control circuits such as rendering local overheating causing chip junction area burned;
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