故障信息处理测试中的边界扫描技术探析 - 论文发表 - 论文秘籍网 关键词：边界扫描技术；JTAG；边界扫描设计 [gap=596]Key words: boundary scan technology; JTAG; boundary scan design
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This paper Outlines the design of features related to test and then details the Boundary Scan test strategies developed for different MCM.
本文概要论及与测试相关的设计特性，详细讨论了不同MCM的边界扫描测试策略。
To resolve them, two design methods of board level dynamic BS chain based on boundary scan technology are proposed in this paper.
为了解决上述问题，文中提出了两种基于边界扫描技术的板级动态链路设计方法。
This paper chooses USB logic analyzer as a typical tested object, and carries through a second develop to design it supporting IEEE 1149.1 boundary-scan function for testability.
本文以usb逻辑分析仪作为一种典型的被测对象，进行了可测性设计的再开发工作，使其具有支持IEEE 1149.1边界扫描功能的设备结构。
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